- is the most modern, state-of-the-art, single crystal X-Ray Diffractometer.
- has an ingenious Kappa geometry which
- provides additional freedom to orient the crystal with zero obstructions!
- is the most computerized in the market, including:
- Computer-controlled Detector Movement.
- Fully-integrated Low Temperature device (for the best available device).
- is connected to networked multi-user Linux Systems allowing remote access.
Data collection times:
For a big, good quality, strongly
diffracting crystal with high symmetric crystal system, the data can be
collected in as little as 10 minutes! But for a small, weakly diffracting
crystal with low symmteric system, the data collection may take several hours.
The low & high extremes of the times we have used so far: 8 minutes & 48 hours (prior to data processing)
The most common data collection time range: 1-4 hours.
In the earlier day diffractometers, it used to take minimum of 12 hours to
more than a week (with 2-3 days being normal) for similar data collection. Also many times small crystals
could not be used at all, despite whatever time we were willing to spend.
- Low noise, high sensitivity CCD detector
- Fast readout
- High precision four circle Kappa axis goniometer with maximum flexibility
- Automated (motor driven) Detector to change detector distance
- All axes, including distance movement, under computer control
- High speed shutter
- video microscope (not color)
For more information on the KappaCCD system visit the KappaCCD page at Nonius
- Easy and straightforward data collection in a few hours or less
- Short exposure times, yet high signal to noise images and data sets
- Small dead time, high throughput, high efficiency
- Optimal orienting of sample for most efficient data collection strategy
- All orientations of the crystal accessible for face indexing and calculation of numerical absorption correction
- Four scanning axes available
- Alignment of crystal, screened precession pictures and axial photographs for verification of lattice parameters and diffraction symmetry
- Both wide- and fine-slicing modes supported